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General
Features Evaluation Learning Development |
Easy to learn and use | |
Robust, flexible and powerful | ||
Accurate: sub-pixel measurement and calibration | ||
Thread-safe | ||
Straightforward
evaluation, learning and development thanks to dedicated accessories |
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Compatible with | ||
- Windows® x86 processor architecture | ||
- A wide variety of programming
languages and development environments |
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Open eVision 1.1 New Features |
Flexible Masks provide a powerful way of restricting the processing to freely shaped parts of an image |
New image processing functions |
- Interest point detectors: Canny edge and Harris corner detectors |
- Hit-and-miss transform |
Blob analysis with a global increase of the performance |
- For large images and images with numerous objects |
And more |
- Improved execution time through the use of SSE2 technology |
- Thread-safety |
- Support of new IDEs and OS - including Windows 7® and Vista® |
- Support for additional image formats -JPEG-2000, PNG |
- Robust and fast geometric pattern matching in the consistent edges mode |
- New Open eVision learning accessories |
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